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矢野 雅大; 魚住 雄輝*; 保田 諭; 朝岡 秀人
no journal, ,
We have observed time evolution of morphology and electronic state of oxide Si(110) during reduction process. We found metastable area and state by means of scanning tunneling microscope (STM) and X-ray photoemission spectroscopy (XPS), respectively.